IP Library › Assignment 024858/0251
Patent Assignment
Reel/Frame 024858/0251

Assignment of Assignor's Interest

Recorded: 2010-08-19 Pages: 2
Assignors
FU, HSUEH-HUNG
Executed: 2007-02-15
CHANG, CHIH-WEI
Executed: 2007-02-15
CHEN, SHIH-CHANG
Executed: 2007-02-15
CHANG, CHIN-PIAO
Executed: 2007-02-15
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, 300-77, TAIWAN
Covered Property (1)
System and Method for Film Stress and Curvature Gradient Mapping for Screening Problematic Wafers
Patent: 7,805,258 →
Application: 11/707,662 →
Publication: US 2008/0199978
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 6, 2007
From: PAN, SHING-CHYANG; LIN, WEI-JUNG; HUANG, TSUNG-HSUN
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 019391/0695 →