Patent Assignment
Reel/Frame 019554/0215
Assignment of Assignor's Interest
Recorded: 2007-07-13
Pages: 3
Assignors
MEYER, MORITZ ANDREAS
Executed: 2007-02-09
LANGER, ECKHARD
Executed: 2007-02-09
KOSCHINSKY, FRANK
Executed: 2007-02-13
Assignee
ADVANCED MICRO DEVICES, INC.
5204 EAST BEN WHITE BOULEVARD, AUSTIN, TEXAS, 78741
Covered Property
(1)
Method of Testing an Integrity of a Material Layer in a Semiconductor Structure
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.