IP Library › Assignment 019653/0312
Patent Assignment
Reel/Frame 019653/0312

Assignment of Assignor's Interest

Recorded: 2007-08-06 Pages: 4
Assignors
KANDEL, DANIEL
Executed: 2007-07-25
LEVINSKI, VLADIMIR
Executed: 2007-07-15
ADEL, MICHAEL E.
Executed: 2007-07-15
SELIGSON, JOEL L.
Executed: 2007-07-15
Assignee
KLA-TENCOR TECHNOLOGIES CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties (3)
Order Selected Overlay Metrology
Patent: 7,528,941 →
Application: 11/754,892 →
Publication: US 2007/0279630
Order selected overlay metrology
Application: 60/810,560 →
Systems and techniques for semiconductor metrology inspection
Application: 60/897,637 →