IP Library Assignment 019672/0606
Patent Assignment
Reel/Frame 019672/0606

Assignment of Assignor's Interest

Recorded: 2007-08-02 Pages: 2
Assignors
TANAKA, KEIICHI
Executed: 2007-07-26
ODAWARA, AKIKAZU
Executed: 2007-07-26
NAKAYAMA, SATOSHI
Executed: 2007-07-26
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMU-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Superconducting X-Ray Detector and X-Ray Analysis Apparatus Using the Same
Patent: 7,589,323 →
Application: 11/794,288 →
Publication: US 2007/0291902
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →