IP Library Granted Patent US 7,589,323
Granted Patent B2
US 7,589,323 · App. 11/794,288 · Granted Sep 15, 2009

Superconducting X-ray detector and X-ray analysis apparatus using the same

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Quick Facts
Patent No.
US 7,589,323
App. No.
11/794,288
Granted
Sep 15, 2009
Kind
B2
Abstract

To provide a superconducting X-ray detector capable of carrying out a measurement by a high energy resolution by restraining a reduction in a sensitivity by a self magnetic field. A superconducting X-ray detector comprising a temperature detector 6 for detecting a temperature change by heat generated when an X-ray is absorbed, and a heat link 3 for controlling a heat flow amount of escaping the generated heat to a support board i, wherein the temperature detector 6 comprises a heat conducting multilayer thin film, the superconducting X-ray detector is constituted by a structure of providing a superconductor layer 4 above the heat link 3 and providing an insulating member 2 between the superconductor layer 4 and the temperature detector 6 , the superconductor layer 4 and the temperature detector 6 are connected by a superconducting wiring 7 and uses materials by which superconducting transition temperatures of the superconductor layer 4 and the superconducting wiring 7 are higher than a superconducting transition temperature of the temperature detector 6.

Claims (14)

1. A superconducting X-ray detector comprising:

a temperature detector comprising a superconducting multilayer thin film for detecting a temperature change by heat generated when X-rays are absorbed, and a heat link for controlling a heat flow amount of generated heat that escapes to a support board;

wherein the superconducting X-ray detector is constituted by a structure that comprises a superconductor layer disposed above the heat link and an insulating member disposed between the superconductor layer and the temperature detector; and

wherein the superconductor layer and the temperature detector are connected by a superconducting wiring and are constituted by materials by which superconducting transition temperatures of the superconductor layer and the superconducting wiring are higher than a superconducting transition temperature of the temperature detector.

2. A superconducting X-ray detector comprising:

a temperature detector comprising a superconducting multilayer thin film for detecting a temperature change by heat generated when X-rays are absorbed, and a heat link for controlling a heat flow amount of generated heat that escapes to a support board;

wherein the superconducting X-ray detector is constituted by a structure that comprises a superconductor layer disposed above the heat link, an insulating member disposed above the superconductor layer, and the temperature detector disposed above the insulating member; and

wherein the superconductor layer and the temperature detector are connected by a superconducting wiring, and the superconductor layer and the superconducting multilayer thin film of the temperature detector are constituted by the same material.

3. An X-ray analysis apparatus comprising:

an analysis apparatus including a sample chamber, a lens-barrel contained in the sample chamber for emitting any of an electron beam, ions, and X-rays, a sample stage and a superconducting X-ray detector for irradiating any of the electron beam, the ions, and the X-rays to a sample and analyzing an energy of an X-ray generated from the sample to thereby identify a composition of the sample;

wherein the superconducting X-ray detector according to claim 1 is used for the superconducting X-ray detector.

4. An X-ray analysis apparatus comprising:

an analysis apparatus including a sample chamber, a lens-barrel contained in the sample chamber for emitting any of an electron beam, ions, and X-rays, a sample stage and a superconducting X-ray detector for irradiating any of the electron beam, the ions, and the X-rays to a sample and analyzing an energy of an X-ray generated from the sample to thereby identify a composition of the sample;

wherein the superconducting X-ray detector according to claim 2 is used for the superconducting X-ray detector.

Assignments (2)
CHANGE OF NAME Recorded Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2007
From: TANAKA, KEIICHI; ODAWARA, AKIKAZU; NAKAYAMA, SATOSHI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 019672/0606 →