IP Library Assignment 019811/0755
Patent Assignment
Reel/Frame 019811/0755

Assignment of Assignor's Interest

Recorded: 2007-09-04 Pages: 2
Assignors
NAKAMURA, TAKAYUKI
Executed: 2007-06-20
IWAI, TOSHIMICHI
Executed: 2007-06-20
SHIDA, SOICHI
Executed: 2007-06-20
HIROYAMA, MITSUO
Executed: 2007-06-21
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property (1)
Scanning Electron Microscope with Length Measurement Function and Dimension Length Measurement Method
Patent: 7,791,022 →
Application: 11/821,028 →
Publication: US 2008/0224039
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →