Patent Assignment
Reel/Frame 019822/0659
Assignment of Assignor's Interest
Recorded: 2007-09-13
Pages: 6
Assignors
TAKANO, HIDEAKI
Executed: 2007-09-05
SHIMIZU, MIYUKI
Executed: 2007-09-05
SENDA, TAKESHI
Executed: 2007-09-05
IZUNOME, KOJI
Executed: 2007-09-05
HAYASHI, YOSHINORI
Executed: 2007-09-05
HAMATANI, KAZUHIKO
Executed: 2007-09-05
Assignees
SHIBAURA MECHATRONICS CORPORATION
5-1, KASAMA 2-CHOME, SAKAE-KU, YOKOHAMA-SHI, KANAGAWA, 247-8610, JAPAN
COVALENT MATERIALS CORPORATION
6-3, OHSAKI 1-CHOME, SHINAGAWA-KU, TOKYO, 141-0032, JAPAN
Covered Property
(1)
Surface Inspection Apparatus and Surface Inspection Method for Strained Silicon Wafer
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 11, 2013
From: COVALENT MATERIALS CORPORATION
To: COVALENT SILICON CORPORATION
Reel/Frame 029962/0497 →
Change of Name
Mar 13, 2013
From: COVALENT SILICON CORPORATION
To: GLOBALWAFERS JAPAN CO., LTD.
Reel/Frame 029991/0421 →
Assignment of Assignor's Interest
Jan 23, 2018
From: SHIBAURA MECHATRONICS CORPORATION
To: GLOBALWAFERS JAPAN CO., LTD.
Reel/Frame 044695/0948 →