IP Library › Assignment 044695/0948
Patent Assignment
Reel/Frame 044695/0948

Assignment of Assignor's Interest

Recorded: 2018-01-23 Pages: 4
Assignor
SHIBAURA MECHATRONICS CORPORATION
Executed: 2017-12-18
Assignee
GLOBALWAFERS JAPAN CO., LTD.
6-861-5, SEIRO-MACHI HIGASHIKO, KITAKANBARA-GUN, NIIGATA, 957-0197, JAPAN
Covered Property (1)
Surface Inspection Apparatus and Surface Inspection Method for Strained Silicon Wafer
Patent: 7,679,730 →
Application: 11/908,554 →
Publication: US 2009/0066933
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 13, 2007
From: TAKANO, HIDEAKI; SHIMIZU, MIYUKI; SENDA, TAKESHI; IZUNOME, KOJI
To: SHIBAURA MECHATRONICS CORPORATION; COVALENT MATERIALS CORPORATION
Reel/Frame 019822/0659 →
Assignment of Assignor's Interest Mar 11, 2013
From: COVALENT MATERIALS CORPORATION
To: COVALENT SILICON CORPORATION
Reel/Frame 029962/0497 →
Change of Name Mar 13, 2013
From: COVALENT SILICON CORPORATION
To: GLOBALWAFERS JAPAN CO., LTD.
Reel/Frame 029991/0421 →