IP Library › Assignment 019897/0885
Patent Assignment
Reel/Frame 019897/0885

Assignment of Assignor's Interest

Recorded: 2007-09-28 Pages: 3
Assignor
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Apparatus and Method for Enhanced Critical Dimension Scatterometry
Patent: 7,502,101 →
Application: 11/361,673 →
Publication: US 2006/0289789
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 26, 2007
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 019887/0144 →
Merger Sep 28, 2007
From: ACCENT OPTICAL TECHNOLOGIES INC.
To: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.
Reel/Frame 019897/0863 →
Assignment of Assignor's Interest Nov 24, 2008
From: LIU, SEAN
To: NANOMETRICS INCORPORATED
Reel/Frame 021882/0336 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →