IP Library Assignment 019972/0184
Patent Assignment
Reel/Frame 019972/0184

Assignment of Assignor's Interest

Recorded: 2007-10-17 Pages: 3
Assignor
OOKUBO, NORIO
Executed: 2007-09-27
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Scanning Type Probe Microscope
Patent: 7,588,605 →
Application: 11/835,036 →
Publication: US 2008/0048114
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →