IP Library Assignment 020415/0325
Patent Assignment
Reel/Frame 020415/0325

Assignment of Assignor's Interest

Recorded: 2008-01-25 Pages: 2
Assignors
HASHIMOTO, KIYOKAZU
Executed: 2008-01-15
TSUNESADA, NOBUTOSHI
Executed: 2008-01-15
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property (1)
Semiconductor Device and Method of Testing Semiconductor Device
Patent: 7,639,554 →
Application: 12/018,993 →
Publication: US 2008/0192554
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 2, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025235/0423 →