IP Library Assignment 020637/0025
Patent Assignment
Reel/Frame 020637/0025

Assignment of Assignor's Interest

Recorded: 2008-03-04 Pages: 6
Assignor
WEINER, KURT H.
Executed: 2007-09-25
Assignee
KLA-TENCOR TECHNOLOGIES CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Test Structures and Methods for Inspection of Semiconductor Integrated Circuits
Application: 11/675,021 →
Publication: US 2008/0246030
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 12, 2007
From: PINTO, GUSTAVO A.; RICHARDSON, NEIL; MANTALAS, LYNDA C.
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 019818/0101 →
Merger Oct 3, 2013
From: KLA-TENCOR TECHNOLOGIES CORPORATION
To: KLA-TENCOR CORPORATION
Reel/Frame 031339/0314 →