IP Library › Assignment 031339/0314
Patent Assignment
Reel/Frame 031339/0314

Merger

Recorded: 2013-10-03 Pages: 6
Assignor
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties (3)
Test Structures and Methods for Inspection of Semiconductor Integrated Circuits
Application: 11/675,021 →
Publication: US 2008/0246030
Apparatus and Methods for Determining Overlay of Structures Having Rotational or Mirror Symmetry
Patent: 9,182,680 →
Application: 13/407,124 →
Publication: US 2012/0153281
Apparatus and Methods for Determining Overlay of Structures Having Rotational or Mirror Symmetry
Patent: 45,245 →
Application: 13/875,160 →
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 12, 2007
From: PINTO, GUSTAVO A.; RICHARDSON, NEIL; MANTALAS, LYNDA C.
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 019818/0101 →
Assignment of Assignor's Interest Mar 4, 2008
From: WEINER, KURT H.
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 020637/0025 →
Assignment of Assignor's Interest Feb 28, 2012
From: GHINOVKER, MARK
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 027776/0912 →
Assignment of Assignor's Interest Sep 30, 2013
From: GHINOVKER, MARK
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 031313/0423 →