IP Library › Assignment 020747/0129
Patent Assignment
Reel/Frame 020747/0129

Assignment of Assignor's Interest

Recorded: 2008-04-03 Pages: 2
Assignors
NAKAHIRA, KENJI
Executed: 2007-12-20
HONDA, TOSHIFUMI
Executed: 2007-12-25
MIYAMOTO, ATSUSHI
Executed: 2007-12-20
Assignee
HITACHI-HIGH TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope and Method for Processing an Image Obtained by the Scanning Electron Microscope
Patent: 8,106,357 →
Application: 12/016,290 →
Publication: US 2008/0251719
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →