Patent Assignment
Reel/Frame 020757/0526
Assignment of Assignor's Interest
Recorded: 2008-04-04
Pages: 3
Assignors
FUKAI, TAKAYUKI
Executed: 2008-02-08
MATOBA, YOSHIKI
Executed: 2008-02-12
HASEGAWA, KIYOSHI
Executed: 2008-02-12
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
X-Ray Analysis Apparatus and X-Ray Analysis Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.