X-ray analysis apparatus and X-ray analysis method
View Patent ↗In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.
1. An X-ray analysis apparatus comprising:
a radiation source configured to irradiate a radiant ray to a sample;
a radiant ray adjustment mechanism configured to adjust an intensity of the radiant ray;
an X-ray detector configured to detect a characteristic X-ray and a scattered X-ray, which are radiated from the sample, and output a signal including energy information of the characteristic X-ray and the scattered X-ray;
an analyzer configured to analyze the signal;
an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and configured to adjust a total intensity of the characteristic X-ray and the scattered X-ray, which are entered to the X-ray detector; and
a control section configured to control the incident X-ray adjustment mechanism and the radiant ray adjustment mechanism such that the total intensity of the characteristic X-ray and the scattered X-ray, which are detected by the X-ray detector, is approximately a maximum obtainable X-ray intensity, and an intensity of the radiant ray becomes within a normal operation range of a radiant ray irradiation power of the radiation source.
2. An X-ray analysis apparatus according to claim 1 , wherein the X-ray detector has a detection face receiving the characteristic X-ray and the scattered X-ray, and the incident X-ray adjustment mechanism is a collimator configured to adjust incident solid angles of the characteristic X-ray and the scattered X-ray in regard to the detection face.
3. An X-ray analysis apparatus according to claim 2 , wherein the incident X-ray adjustment mechanism is an opening diameter alteration mechanism which has an X-ray incident hole allowing the characteristic X-ray and the scattered X-ray to pass through it and enter the detection face, and the opening diameter alteration mechanism configured to alter an opening diameter of the X-ray incident hole.
4. An X-ray analysis apparatus according to claim 2 , wherein the incident X-ray adjustment mechanism is an opening diameter alteration mechanism which has plurality of X-ray incident holes whose opening diameters mutually differ, and arbitrarily disposes any one of the X-ray incident holes between the detection face and the sample.
5. An X-ray analysis apparatus according to claim 3 , wherein the incident X-ray adjustment mechanism has a position adjustment mechanism configured to adjust a distance between the X-ray incident hole and the detection face.
6. An X-ray analysis method comprising:
irradiating a radiant ray to a sample from a radiation source at a intensity previously set for a rough measurement;
detecting, by an X-ray detector, a rough measurement value that is a total intensity of a characteristic X-ray and a scattered X-ray, which are radiated from the sample;
performing a main measurement by adjusting, based on the intensity of the radiant ray previously set for the rough measurement and the rough measurement value, the intensity of the radiant ray, using a radiant ray adjustment mechanism, such that the total intensity of the characteristic X-ray and the scattered X-ray, which are detected by the X-ray detector, is approximately a maximum obtainable X-ray intensity and an intensity of the radiant ray becomes within a normal operation range of a radiant ray irradiation power of the radiation source, and by adjusting a total intensity of the characteristic X-ray and the scattered X-ray, which are entered to the X-ray detector, using an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector;
outputting a signal including energy information of the characteristic X-ray and the scattered X-ray, that the X-ray detector obtains in the main measurement; and
analyzing the signal by an analyzer.