Patent Assignment
Reel/Frame 020810/0018
Assignment of Assignor's Interest
Recorded: 2008-04-04
Pages: 3
Assignors
MICHIMATA, SHIGETOMI
Executed: 2008-03-28
YANAGISAWA, MASAYUKI
Executed: 2008-03-28
KUROYANAGI, KAZUMASA
Executed: 2008-03-28
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Probe Resistance Measurement Method and Semiconductor Device with Pads for Probe Resistance Measurement
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.