IP Library › Assignment 020889/0145
Patent Assignment
Reel/Frame 020889/0145

Assignment of Assignor's Interest

Recorded: 2008-05-01 Pages: 6
Assignors
ZHANG, KANGPING
Executed: 2008-04-23
LIN, FONG-LONG
Executed: 2008-04-26
Assignee
SILICON STORAGE TECHNOLOGY, INC.
1171 SONORA COURT, SUNNYVALE, CALIFORNIA, 94086
Covered Property (1)
Method of Testing an Integrated Circuit Die, and an Integrated Circuit Die
Patent: 7,728,361 →
Application: 12/113,881 →
Publication: US 2009/0273007
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Nunc Pro Tunc Assignment Aug 3, 2010
From: SILICON STORAGE TECHNOLOGY, INC.
To: GREENLIANT SYSTEMS, INC.
Reel/Frame 024776/0624 →
Assignment of Assignor's Interest Aug 3, 2010
From: GREENLIANT SYSTEMS, INC.
To: GREENLIANT LLC
Reel/Frame 024776/0637 →