Patent Assignment
Reel/Frame 020947/0626
Assignment of Assignor's Interest
Recorded: 2008-05-14
Pages: 2
Assignors
ISHIJIMA, TATSUKI
Executed: 2008-02-05
SASADA, KATSUHIRO
Executed: 2008-02-05
FUKAYA, RITSUO
Executed: 2008-02-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Re-Record to Correct the Name of the First Assignor, Previously Recorded on Reel 020947 Frame 0626.
Oct 10, 2008
From: ISHIJIMA, TATSUAKI; SASADA, KATSUHIRO; FUKAYA, RITSUO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 021670/0769 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →