IP Library Assignment 021670/0769
Patent Assignment
Reel/Frame 021670/0769

Re-Record to Correct the Name of the First Assignor, Previously Recorded on Reel 020947 Frame 0626.

Recorded: 2008-10-10 Pages: 3
Assignors
ISHIJIMA, TATSUAKI
Executed: 2008-02-05
SASADA, KATSUHIRO
Executed: 2008-02-05
FUKAYA, RITSUO
Executed: 2008-02-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope
Patent: 7,745,782 →
Application: 12/038,641 →
Publication: US 2008/0203298
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 14, 2008
From: ISHIJIMA, TATSUKI; SASADA, KATSUHIRO; FUKAYA, RITSUO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 020947/0626 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →