Patent Assignment
Reel/Frame 020957/0167
Assignment of Assignor's Interest
Recorded: 2008-05-16
Pages: 3
Assignors
FUJII, TOSHIAKI
Executed: 2008-03-25
TAKAHASHI, HARUO
Executed: 2008-03-26
TASHIRO, JUNICHI
Executed: 2008-03-31
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Apparatus for Working and Observing Samples and Method of Working and Observing Cross Sections
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →