IP Library › Assignment 021054/0647
Patent Assignment
Reel/Frame 021054/0647

Assignment of Assignor's Interest

Recorded: 2008-06-03 Pages: 3
Assignors
TASHIRO, JUNICHI
Executed: 2008-03-25
MUNEKANE, MASANAO
Executed: 2008-04-03
Assignee
SII NANO TECHNOLOGY, INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Sample Relocation Method in Charged Particle Beam Apparatus and Charged Particle Beam Apparatus as Well as Sample for Transmission Electron Microscope
Patent: 7,872,231 →
Application: 12/047,022 →
Publication: US 2008/0302961
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →