Patent Assignment
Reel/Frame 021100/0821
Assignment of Assignor's Interest
Recorded: 2008-06-16
Pages: 2
Assignor
OTSUKI, KAZUTAKA
Executed: 2008-05-19
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Method of Evaluating Thermal Stress Resistance of Semiconductor Device, and Semiconductor Wafer Having Test Element
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.