Assignment of Assignor's Interest

Recorded: 2008-06-26 Pages: 3

Assignor

SAEKI, YUTAKA

Executed: 2008-06-20

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Test circuit and test method

Application: 12/213,961 →

Publication: US 2009/0009184

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.