IP Library › Assignment 021445/0887
Patent Assignment
Reel/Frame 021445/0887

Assignment of Assignor's Interest

Recorded: 2008-08-27 Pages: 2
Assignors
JAHNKE, TORSTEN
Executed: 2008-08-01
HAGGERTY, MICHAEL RICHARD
Executed: 2008-08-01
Assignee
JPK INSTRUMENTS AG
BOUCHESTRASSE 12, 12435 BERLIN, GERMANY
Covered Property (1)
Method for the Operation of a Measurement System with a Scanning Probe Microscope and a Measurement System
Patent: 8,368,017 →
Application: 12/160,039 →
Publication: US 2008/0308726
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →
Change of Address Jul 3, 2023
From: JPK INSTRUMENTS AG
To: JPK INSTRUMENTS AG
Reel/Frame 064205/0902 →