IP Library Assignment 064205/0902
Patent Assignment
Reel/Frame 064205/0902

Change of Address

Recorded: 2023-07-03 Pages: 25
Assignor
JPK INSTRUMENTS AG
Executed: 2018-09-04
Assignee
JPK INSTRUMENTS AG
COLDITZSTRASSE 34-36, BERLIN, 12099, GERMANY
Covered Properties (14)
Method of and an Apparatus for Measuring a Specimen by Means of a Scanning Probe Microscope
Patent: 6,998,602 →
Application: 10/490,440 →
Publication: US 2005/0023481
Probe mounting device for a scanning probe microscope
Patent: 7,114,405 →
Application: 10/490,441 →
Publication: US 2005/0017150
Apparatus and Method for a Scanning Probe Microscope
Patent: 7,473,894 →
Application: 11/378,258 →
Publication: US 2006/0168703
Device for Receiving a Test Sample
Patent: 8,506,909 →
Application: 11/659,374 →
Publication: US 2008/0163702
A Method and a Device for the Positioning of a Displacable Component in an Examining System
Patent: 7,934,323 →
Application: 11/992,850 →
Publication: US 2009/0140685
Method for Examining a Measurement Object, and Apparatus
Patent: 8,769,711 →
Application: 12/083,303 →
Publication: US 2009/0205089
Method for the Operation of a Measurement System with a Scanning Probe Microscope and a Measurement System
Patent: 8,368,017 →
Application: 12/160,039 →
Publication: US 2008/0308726
Method for Providing a Probe for a Probe-Microscopic Analysis of a Test Sample in a Probe Microscope and Arrangement with a Probe Microscope
Patent: 7,971,266 →
Application: 12/320,114 →
Publication: US 2009/0300807
Apparatus and Method for Examining a Specimen by Means of Probe Microscopy
Patent: 9,063,335 →
Application: 12/377,709 →
Publication: US 2010/0229262
Method for Examining a Test Sample Using a Scanning Probe Micrscope, Measurement System and a Measuring Probe System
Patent: 8,381,311 →
Application: 12/600,289 →
Publication: US 2010/0218284
Method and Apparatus for Characterizing a Sample with Two or More Optical Traps
Patent: 8,415,613 →
Application: 12/602,151 →
Publication: US 2010/0251437
Measuring Probe Device for a Probe Microscope, Measuring Cell and Scanning Probe Microscope
Patent: 8,505,109 →
Application: 12/670,561 →
Publication: US 2010/0263096
Method and Apparatus for the Combined Analysis of a Sample with Objects to Be Analyzed
Patent: 8,898,809 →
Application: 12/670,570 →
Publication: US 2010/0263098
Apparatus and a Method for Investigating a Sample by Means of Several Investigation Methods
Patent: 9,080,937 →
Application: 13/937,237 →
Publication: US 2014/0016119
Related Assignments (15)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 21, 2004
From: SUNWOLDT, OLAF; HASCHKE, HEIKO
To: JPK INSTRUMENTS AG
Reel/Frame 015898/0238 →
Assignment of Assignor's Interest Sep 22, 2004
From: KAMPS, JORN
To: JPK INSTRUMENTS AG
Reel/Frame 015922/0879 →
Assignment of Assignor's Interest Mar 20, 2006
From: KNEBEL, DETLEF; JAHNKE, TORSTEN; SUNWOLDT, OLAF
To: JPK INSTRUMENTS AG
Reel/Frame 017699/0853 →
Assignment of Assignor's Interest Sep 14, 2007
From: SUNWOLDT, OLAF; KNEBEL, DETLEF
To: JPK INSTRUMENTS AG
Reel/Frame 019908/0387 →
Assignment of Assignor's Interest Aug 27, 2008
From: JAHNKE, TORSTEN; HAGGERTY, MICHAEL RICHARD
To: JPK INSTRUMENTS AG
Reel/Frame 021445/0887 →
Assignment of Assignor's Interest Mar 3, 2009
From: SOMMER, GUNNAR; KAMPS, JORN
To: JPK INSTRUMENTS AG
Reel/Frame 022334/0816 →
Assignment of Assignor's Interest Mar 13, 2009
From: KNEBEL, DETLEF; JAHNKE, TORSTEN
To: JPK INSTRUMENTS AG
Reel/Frame 022389/0839 →
Assignment of Assignor's Interest Aug 17, 2009
From: JAHNKE, TORSTEN; MULLER, TORSTEN; KNEBEL, DETLEF; POOLE, KATHRYN
To: JPK INSTRUMENTS AG
Reel/Frame 023106/0400 →
Assignment of Assignor's Interest May 6, 2010
From: JAHNKE, TORSTEN
To: JPK INSTRUMENTS AG
Reel/Frame 024343/0413 →
Assignment of Assignor's Interest May 21, 2010
From: HEYN, SVEN-PETER; KERSSEMAKERS, JACOB; KNEBEL, DETLEF; EGGERT, HELGE
To: JPK INSTRUMENTS AG
Reel/Frame 024423/0189 →
Assignment of Assignor's Interest Jun 22, 2010
From: JAHNKE, TORSTEN; MULLER, TORSTEN; POOLE, KATHRYN ANNE; KNEBEL, DETLEF
To: JPK INSTRUMENTS AG
Reel/Frame 024574/0478 →
Assignment of Assignor's Interest Jun 22, 2010
From: MULLER, TORSTEN; POOLE, KATHRYN ANNE; KNEBEL, DETLEF; JAHNKE, TORSTEN
To: JPK INSTRUMENTS AG
Reel/Frame 024574/0336 →
Assignment of Assignor's Interest Aug 13, 2013
From: BEHME, GERD; JANKOWSKI, TILO; JAHNKE, TORSTEN
To: JPK INSTRUMENTS AG
Reel/Frame 030994/0263 →
Assignment of Assignor's Interest Mar 6, 2014
From: JÄHNKE, TORSTEN
To: JPK INSTRUMENTS AG
Reel/Frame 032369/0904 →
Merger Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →