IP Library Granted Patent US 8,505,109
Granted Patent B2
US 8,505,109 · App. 12/670,561 · Granted Aug 6, 2013

Measuring probe device for a probe microscope, measuring cell and scanning probe microscope

Inventors: Torsten Jähnke (Berlin, DE); Torsten Müller (Berlin, DE); Kathryn Anne Poole (Berlin, DE); Detlef Knebel (Berlin, DE)
Assignee: JPK Instruments AG
G01Q30/14
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Quick Facts
Patent No.
US 8,505,109
App. No.
12/670,561
Granted
Aug 6, 2013
Kind
B2
Abstract

The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.

Claims (13)

1. A measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and, arranged on the measuring probe holder, a measuring probe, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe, wherein the measuring probe chamber is configured to hold a liquid when separating the measuring probe chamber from a liquid level in which the sample to be examined is arranged, such that the measuring probe is completely covered by the liquid when the measuring probe chamber is separated from the liquid level.

2. The measuring probe device according to claim 1 , wherein the measuring probe chamber has a sleeve structure.

3. The measuring probe device according to claim 1 , wherein the measuring probe chamber is configured to form, with the liquid that is to be received, a liquid bell surrounding the measuring probe.

4. The measuring probe device according to claim 1 , wherein segments of the wall of the measuring probe chamber are made at least partially of a flexible material.

5. The measuring probe device according to claim 1 , wherein segments of the wall of the measuring probe chamber have, at least partially, a hydrophilic surface coating at least on an inside surface.

6. The measuring probe device according to claim 1 , wherein the measuring probe chamber is formed with several partial chambers.

7. The measuring probe device according to claim 5 , wherein the measuring probe chamber is formed from an inner and an outer measuring probe chamber.

8. The measuring probe device according to claim 1 , wherein a volume enclosed by the measuring probe chamber can be adjusted.

9. The measuring probe device according to claim 1 , wherein a fluid channel, which is in fluid connection with an internal space of the measuring probe chamber and is configured for introducing the liquid into the measuring probe chamber and for carrying it away from the measuring probe chamber.

10. The measuring probe device according to claim 1 , wherein the measuring probe chamber is made at least in some sections of an optically transparent material.

11. The measuring probe device according to claim 1 , wherein the measuring probe is removably fastened to the measuring probe holder.

12. The measuring probe device according to claim 1 , wherein the measuring probe is a cantilever.

13. A scanning probe microscope with a measuring probe device according to claim 1 .

Assignments (3)
MERGER Recorded Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →
CHANGE OF ADDRESS Recorded Jul 3, 2023
From: JPK INSTRUMENTS AG
To: JPK INSTRUMENTS AG
Reel/Frame 064205/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 22, 2010
From: JAHNKE, TORSTEN; MULLER, TORSTEN; POOLE, KATHRYN ANNE; KNEBEL, DETLEF
To: JPK INSTRUMENTS AG
Reel/Frame 024574/0478 →
Priority Claims (1)
DE 10 2007 034 853 · Jul 24, 2007 · national
Continuity (1)
Related Publication 20100263096A1 · Oct 14, 2010