IP Library › Assignment 024574/0478
Patent Assignment
Reel/Frame 024574/0478

Assignment of Assignor's Interest

Recorded: 2010-06-22 Pages: 4
Assignors
JAHNKE, TORSTEN
Executed: 2010-05-07
MULLER, TORSTEN
Executed: 2010-05-06
POOLE, KATHRYN ANNE
Executed: 2010-05-12
KNEBEL, DETLEF
Executed: 2010-05-06
Assignee
JPK INSTRUMENTS AG
BOUCHESTRASSE 12, 12435 BERLIN, GERMANY
Covered Property (1)
Measuring Probe Device for a Probe Microscope, Measuring Cell and Scanning Probe Microscope
Patent: 8,505,109 →
Application: 12/670,561 →
Publication: US 2010/0263096
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →
Change of Address Jul 3, 2023
From: JPK INSTRUMENTS AG
To: JPK INSTRUMENTS AG
Reel/Frame 064205/0902 →