Patent Assignment
Reel/Frame 024343/0413
Assignment of Assignor's Interest
Recorded: 2010-05-06
Pages: 2
Assignor
JAHNKE, TORSTEN
Executed: 2010-04-09
Assignee
JPK INSTRUMENTS AG
BOUCHESTRASSE 12, 12435 BERLIN, GERMANY
Covered Property
(1)
Method for Examining a Test Sample Using a Scanning Probe Micrscope, Measurement System and a Measuring Probe System
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.