IP Library Assignment 023106/0400
Patent Assignment
Reel/Frame 023106/0400

Assignment of Assignor's Interest

Recorded: 2009-08-17 Pages: 3
Assignors
JAHNKE, TORSTEN
Executed: 2009-03-30
MULLER, TORSTEN
Executed: 2009-03-30
KNEBEL, DETLEF
Executed: 2009-03-30
POOLE, KATHRYN
Executed: 2009-03-31
Assignee
JPK INSTRUMENTS AG
BOUCHESTRASSE 12, 12435 BERLIN, GERMANY
Covered Property (1)
Method for Providing a Probe for a Probe-Microscopic Analysis of a Test Sample in a Probe Microscope and Arrangement with a Probe Microscope
Patent: 7,971,266 →
Application: 12/320,114 →
Publication: US 2009/0300807
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →
Change of Address Jul 3, 2023
From: JPK INSTRUMENTS AG
To: JPK INSTRUMENTS AG
Reel/Frame 064205/0902 →