IP Library Granted Patent US 7,114,405
Granted Patent B2
US 7,114,405 · App. 10/490,441 · Granted Oct 3, 2006

Probe mounting device for a scanning probe microscope

Assignee: JPK Instruments AG
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Quick Facts
Patent No.
US 7,114,405
App. No.
10/490,441
Granted
Oct 3, 2006
Kind
B2
Abstract

The invention relates to a probe ( 207 ) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member ( 200 ) for installation in a measuring assembly of a scanning probe microscope. The probe ( 207 ) is detachably mounted on the retaining member ( 200 ) by means of a clamping member ( 201 ), the clamping member being secured in self-locking fashion to the retaining member ( 200 ).

Claims (16)

1. A probe mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member for installation in a measuring assembly of a scanning probe microscope, characterized in that a probe is detachably mounted on the retaining member by means of a clamping member, the clamping member being secured in self-locking fashion to the retaining member.

2. The device as claimed in claim 1 , wherein the clamping member is detachably mounted on the retaining member.

3. The device as claimed in claim 1 , wherein the clamping member is a spring member.

4. The device as claimed in claim 1 , wherein the clamping member comprises a coating.

5. The device as claimed in claim 1 , wherein the self-locking of the clamping member is realized in a recess formed in the retaining member.

6. The device as claimed in claim 1 , wherein a mounting portion of the probe is disposed at least partly in another recess formed in the retaining member.

7. The device as claimed in claim 1 , wherein the probe is held by means of the clamping member in the area of a bottom surface of the retaining member and at an inclination with respect to the bottom surface so that a measuring tip of the probe protrudes from the bottom surface.

8. The device as claimed in claim 7 , wherein the clamping member is fixed to the retaining member in the area of the bottom surface.

9. The device as claimed in clam 1 , wherein the clamping member is mounted in an area of the retaining member which area is separated from another area of the clamping member by a fluid-tight seal.

10. The device as claimed in claim 1 , wherein the clamping member is fastened at a side surface of the retaining member.

11. The device as claimed in claim 1 , wherein the retaining member comprises a light passage portion of transparent material so that light rays may pass through the light passage portion to the probe or from the probe through the light passage portion.

12. The device as claimed in claim 11 , wherein upper and lower end faces of the light passage portion are polished.

13. The device as claimed in claim 11 , wherein at least the light passage portion is made of glass or plexiglass.

14. The device as claimed in claim 1 , wherein a coil is disposed on the retaining member.

15. The device as claimed in claim 1 , wherein a piezo structural element is disposed on the retaining member.

16. The device as claimed in claim 1 , wherein a fastening member is disposed on the retaining member.

Assignments (3)
MERGER Recorded Jul 3, 2023
From: JPK INSTRUMENTS AG
To: BRUKER NANO GMBH
Reel/Frame 064191/0863 →
CHANGE OF ADDRESS Recorded Jul 3, 2023
From: JPK INSTRUMENTS AG
To: JPK INSTRUMENTS AG
Reel/Frame 064205/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 21, 2004
From: SUNWOLDT, OLAF; HASCHKE, HEIKO
To: JPK INSTRUMENTS AG
Reel/Frame 015898/0238 →
Priority Claims (1)
DE 101 48 322 · Sep 24, 2001 · national
Continuity (1)
Related Publication 20050017150A1 · Jan 27, 2005