Assignment of Assignor's Interest

Recorded: 2008-09-05 Pages: 7

Assignors

HO, TOM T.

Executed: 2008-08-18

BUCKHEIT, JONATHAN B.

Executed: 2008-07-31

WANG, WEIDONG

Executed: 2008-07-25

SUN, XIN

Executed: 2008-08-15

Assignee

MKS INSTRUMENTS, INC.

2 TECH DRIVE, SUITE 201, ANDOVER, MASSACHUSETTS, 01810

Covered Property (1)

Bitmap Cluster Analysis of Defects in Integrated Circuits

Patent: 7,685,481 →

Application: 11/166,960 →

Publication: US 2007/0011509

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.