Patent Assignment
Reel/Frame 024946/0388
Assignment of Assignor's Interest
Recorded: 2010-09-03
Pages: 4
Assignor
MKS INSTRUMENTS, INC.
Executed: 2010-08-11
Assignee
RUDOLPH TECHNOLOGIES, INC.
ONE RUDOLPH ROAD, FLANDERS, NEW JERSEY, 07836
Covered Properties
(7)
Semiconductor Yield Management System and Method
Patent:
6,470,229 →
Application:
09/458,185 →
System and Method for Analyzing Error Information from a Semiconductor Fabrication Process
Semiconductor Yield Management System and Method
Patent:
42,481 →
Application:
10/972,115 →
Bitmap Cluster Analysis of Defects in Integrated Circuits
Analysis Techniques for Multi-Level Memory
Semiconductor yield management system and method
Bitmap Cluster Analysis of Defects in Integrated Circuits
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 20, 2000
From: WANG, WEIDONG; BUCKHEIT, JONATHAN B.; BUDD, DAVID W.
To: YIELD DYNAMICS, INC.
Reel/Frame 010705/0698 →
Assignment of Assignor's Interest
Sep 14, 2001
From: BUCKHEIT, JONATHAN B.; WANG, WEIDONG
To: YIELD DYNAMICS, INC.
Reel/Frame 012172/0366 →
Assignment of Assignor's Interest
Feb 2, 2007
From: HO, TOM T.; BUCKHEIT, JONATHAN B.; WANG, WEIDONG
To: YIELD DYNAMICS, INC.
Reel/Frame 018967/0317 →
Assignment of Assignor's Interest
Sep 5, 2008
From: YIELD DYNAMICS, INC.
To: MKS INSTRUMENTS, INC.
Reel/Frame 021489/0065 →
Assignment of Assignor's Interest
Sep 5, 2008
From: WANG, WEIDONG; BUCKHEIT, JONATHAN B.
To: MKS INSTRUMENTS, INC.
Reel/Frame 021488/0556 →
Assignment of Assignor's Interest
Sep 5, 2008
From: HO, TOM T.; BUCKHEIT, JONATHAN B.; WANG, WEIDONG; SUN, XIN
To: MKS INSTRUMENTS, INC.
Reel/Frame 021488/0567 →
Assignment of Assignor's Interest
Jul 2, 2020
From: RUDOLPH TECHNOLOGIES, INC.
To: ONTO INNOVATION INC.
Reel/Frame 053117/0623 →