IP Library › Assignment 021835/0766
Patent Assignment
Reel/Frame 021835/0766

Assignment of Assignor's Interest

Recorded: 2008-11-14 Pages: 2
Assignors
EZUMI, MAKOTO
Executed: 2008-08-26
IWAMA, SATORU
Executed: 2008-08-26
KAKUTA, JUNICHI
Executed: 2008-09-03
SATO, TAKAHIRO
Executed: 2008-08-29
IKEGAMI, AKIRA
Executed: 2008-09-12
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Inspecting and Measuring Sample and Scanning Electron Microscope
Patent: 7,960,696 →
Application: 12/238,171 →
Publication: US 2009/0084954
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →