IP Library Assignment 021931/0655
Patent Assignment
Reel/Frame 021931/0655

Assignment of Assignor's Interest

Recorded: 2008-12-02 Pages: 5
Assignors
MAZOR, ISAAC
Executed: 2008-11-25
DIKOPOLTSEV, ALEX
Executed: 2008-11-19
YOKHIN, BORIS
Executed: 2008-11-19
AGNIHOTRI, DILEEP
Executed: 2008-11-11
RAFAELI, TZACHI
Executed: 2008-11-19
TOKAR, ALEX
Executed: 2008-11-16
BERMAN, DAVID
Executed: 2008-11-17
BEYLIN, MOSHE
Executed: 2008-11-17
Assignee
JORDAN VALLEY SEMICONDUCTORS LTD.
P.O. BOX 103, MIGDAL HAEMEK 23100, ISRAEL
Covered Property (1)
Automated Selection of X-Ray Reflectometry Measurement Locations
Patent: 7,649,978 →
Application: 12/232,259 →
Publication: US 2009/0074141
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056004/0248 →