Patent Assignment
Reel/Frame 021987/0453
Assignment of Assignor's Interest
Recorded: 2008-12-16
Pages: 4
Assignors
KIKUCHI, ARITOMO
Executed: 2008-11-28
NAKAMURA, HIROTO
Executed: 2008-11-28
TOKITA, JINJI
Executed: 2008-11-28
IKEDA, KATSUHIKO
Executed: 2008-11-28
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Calibration Method of Electronic Device Test Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.