IP Library › Assignment 022076/0987
Patent Assignment
Reel/Frame 022076/0987

Assignment of Assignor's Interest

Recorded: 2009-01-08 Pages: 3
Assignors
USHIKOSHI, KENICHI
Executed: 2008-12-11
TSUNESADA, NOBUTOSHI
Executed: 2008-12-11
HIRAKAWA, TSUYOSHI
Executed: 2008-12-11
KOMATSU, NORIAKI
Executed: 2008-12-11
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit Device and Method of Testing Same
Patent: 7,965,568 →
Application: 12/350,546 →
Publication: US 2009/0190417
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 28, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025214/0187 →