IP Library › Assignment 022111/0557
Patent Assignment
Reel/Frame 022111/0557

Assignment of Assignor's Interest

Recorded: 2009-01-15 Pages: 2
Assignors
MAKUUCHI, MASAMI
Executed: 2008-11-14
ORIHASHI, RITSURO
Executed: 2008-11-26
JINGU, TAKAHIRO
Executed: 2008-11-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Detection Circuit and Foreign Matter Inspection Apparatus for Semiconductor Wafer
Patent: 7,990,529 →
Application: 12/266,663 →
Publication: US 2009/0122305
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →