IP Library Assignment 022318/0462
Patent Assignment
Reel/Frame 022318/0462

Assignment of Assignor's Interest

Recorded: 2009-02-26 Pages: 3
Assignors
HIROI, TAKASHI
Executed: 2009-02-05
YOSHIDA, TAKEYUKI
Executed: 2009-02-06
HOSOYA, NAOKI
Executed: 2009-02-09
HONDA, TOSHIFUMI
Executed: 2009-02-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Inspection Apparatus and an Inspection Method for Inspecting a Circuit Pattern
Patent: 8,121,395 →
Application: 12/393,827 →
Publication: US 2009/0226075
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →