Patent Assignment
Reel/Frame 022330/0266
Assignment of Assignor's Interest
Recorded: 2009-03-02
Pages: 4
Assignors
KATAOKA, AKIRA
Executed: 2009-02-14
ISOMURA, IKUNAO
Executed: 2009-02-16
HIRANO, RYOICHI
Executed: 2009-02-18
KIKUIRI, NOBUTAKA
Executed: 2009-02-18
IIDA, SUSUMU
Executed: 2009-02-18
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY, INC.
8, SHINSUGITA-CHO, ISOGO-KU,, YOKOHAMA-SHI, KANAGAWA, 235-0032, JAPAN
Covered Property
(1)
Ultrafine Lithography Pattern Inspection Using Multi-Stage Tdi Image Sensors with False Image Removability
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest
Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Merger and Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →