IP Library Assignment 022380/0773
Patent Assignment
Reel/Frame 022380/0773

Assignment of Assignor's Interest

Recorded: 2009-03-12 Pages: 4
Assignor
TIMBRE TECHNOLOGIES, INC.
Executed: 2009-03-12
Assignee
TOKYO ELECTRON LIMITED
AKASAKA BIZ TOWER, 3-1 AKASAKA 5-CHOME, MINATO-KU, TOKYO, 107-6325, JAPAN
Covered Properties (28)
Generating Simulated Diffraction Signals for Two-Dimensional Structures
Patent: 7,427,521 →
Application: 10/274,252 →
Publication: US 2004/0078173
Model Optimization for Structures with Additional Materials
Patent: 7,072,049 →
Application: 10/357,705 →
Publication: US 2004/0150838
Adaptive Correlation of Pattern Resist Structures Using Optical Metrology
Patent: 6,791,679 →
Application: 10/358,782 →
Publication: US 2004/0152221
Generic Interface for an Optical Metrology System
Patent: 7,064,829 →
Application: 10/394,327 →
Publication: US 2004/0184035
Edge Roughness Measurement in Optical Metrology
Patent: 7,046,375 →
Application: 10/428,186 →
Publication: US 2004/0218192
Resolution Enhanced Optical Metrology
Patent: 7,274,472 →
Application: 10/447,609 →
Publication: US 2004/0239954
Selecting a Hypothetical Profile to Use in Optical Metrology
Patent: 7,394,554 →
Application: 10/663,300 →
Publication: US 2005/0057748
Azimuthal Scanning of a Structure Formed on a Semiconductor Wafer
Patent: 7,224,471 →
Application: 10/696,246 →
Publication: US 2005/0088665
Parametric Optimization of Optical Metrology Model
Patent: 7,126,700 →
Application: 10/735,212 →
Publication: US 2005/0128489
Optical Metrology Model Optimization for Process Control
Patent: 7,065,423 →
Application: 10/888,726 →
Publication: US 2006/0009872
Adaptive Correlation of Pattern Resist Structures Using Optical Metrology
Patent: 7,440,881 →
Application: 10/910,018 →
Publication: US 2005/0007577
Optical Metrology Model Optimization Based on Goals
Patent: 7,171,284 →
Application: 10/946,729 →
Publication: US 2006/0064280
Examining a Structure Formed on a Semiconductor Wafer Using Machine Learning Systems
Patent: 7,280,229 →
Application: 11/003,961 →
Publication: US 2006/0119863
Optical Metrology Optimization for Repetitive Structures
Patent: 7,388,677 →
Application: 11/061,303 →
Publication: US 2005/0209816
Optical Metrology of a Structure Formed on a Semiconductor Wafer Using Optical Pulses
Patent: 7,274,465 →
Application: 11/061,330 →
Publication: US 2006/0181713
Split Machine Learning Systems
Patent: 7,421,414 →
Application: 11/096,782 →
Publication: US 2006/0224528
Optical Metrology Model Optimization for Repetitive Structures
Patent: 7,355,728 →
Application: 11/155,406 →
Publication: US 2006/0290947
Transforming Metrology Data from a Semiconductor Treatment System Using Multivariate Analysis
Patent: 7,467,064 →
Application: 11/349,773 →
Publication: US 2007/0185684
Optimization of Diffraction Order Selection for Two-Dimensional Structures
Patent: 7,428,060 →
Application: 11/388,265 →
Publication: US 2007/0223011
Library Accuracy Enhancement and Evaluation
Patent: 7,302,367 →
Application: 11/390,798 →
Publication: US 2007/0225940
In-Die Optical Metrology
Patent: 7,474,420 →
Application: 11/396,164 →
Publication: US 2007/0229855
Optimized Characterization of Wafers Structures for Optical Metrology
Patent: 7,444,196 →
Application: 11/408,744 →
Publication: US 2007/0250200
Generic Interface for an Optical Metrology System
Patent: 7,271,902 →
Application: 11/471,892 →
Publication: US 2006/0244966
Optical Metrology Model Optimization for Process Control
Patent: 7,221,989 →
Application: 11/472,133 →
Publication: US 2006/0247816
Optical Metrology Model Optimization for Process Control
Patent: 7,395,132 →
Application: 11/804,998 →
Publication: US 2007/0225851
Azimuthal Scanning of a Structure Formed on a Semiconductor Wafer
Patent: 7,414,733 →
Application: 11/805,932 →
Publication: US 2007/0236705
Generic Interface for an Optical Metrology System
Patent: 7,450,232 →
Application: 11/856,651 →
Publication: US 2008/0037017
Examining a Structure Formed on a Semiconductor Wafer Using Machine Learning Systems
Patent: 7,453,584 →
Application: 11/869,591 →
Publication: US 2008/0033683
Related Assignments (17)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 3, 2003
From: NIU, XINHUI; JAKATDAR, NICKHIL
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 013743/0243 →
Assignment of Assignor's Interest Feb 4, 2003
From: ENGELHARD, DANIEL EDWARD; MADRIAGA, MANUEL B.
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 013738/0726 →
Assignment of Assignor's Interest May 3, 2003
From: BISCHOFF, JOERG; DREGE, EMMANUEL; YEDUR, SANJAY
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 014040/0442 →
Assignment of Assignor's Interest May 28, 2003
From: BISCHOFF, JOERG
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 014126/0778 →
Assignment of Assignor's Interest Jun 30, 2003
From: LI, SHIFANG; BAO, JUNWEI; JAKATDAR, NICKHIL; NIU, XINHUI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 014219/0556 →
Assignment of Assignor's Interest Aug 21, 2003
From: BISCHOFF, JOERG; NIU, XINHUI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 013895/0315 →
Assignment of Assignor's Interest Sep 15, 2003
From: VUONG, VI; BAO, JUNWEI; DODDI, SRINIVAS; DREGE, EMMANUEL
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 014517/0988 →
Assignment of Assignor's Interest Oct 28, 2003
From: BISCHOFF, JOERG; LI, SHIFANG; NIU, XINHUI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 014671/0078 →
Assignment of Assignor's Interest Dec 12, 2003
From: BAO, JUNWEI; VUONG, VI; MADRIAGA, MANUEL; PRAGER, DANIEL
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 014809/0795 →
Assignment of Assignor's Interest Jul 8, 2004
From: PRAGER, DAN; FERNS, JASON; LANE, LAWRENCE; ENGLEHARD, DAN
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 015565/0542 →
Assignment of Assignor's Interest Sep 21, 2004
From: VUONG, VI; DREGE, EMMANUEL; LI, SHIFANG; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 015826/0899 →
Assignment of Assignor's Interest Dec 3, 2004
From: LI, SHIFANG; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 016051/0101 →
Assignment of Assignor's Interest Feb 17, 2005
From: BISCHOFF, JOERG; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 016312/0696 →
Assignment of Assignor's Interest Mar 31, 2005
From: LIU, WEI; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 016449/0978 →
Assignment of Assignor's Interest May 2, 2005
From: VUONG, VI; BAO, JUNWEI; BISCHOFF, JOERG
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 016186/0869 →
Assignment of Assignor's Interest Jun 16, 2005
From: LI, SHIFANG; BAO, JUNWEI; QIU, HONG; LIU, VICTOR
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 016707/0368 →
Assignment of Assignor's Interest Jul 17, 2007
From: LI, SHIFANG; BAO, JUNWEI; JAKATDAR, NICKHIL; NIU, XINHUI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 019562/0676 →