IP Library Assignment 022512/0260
Patent Assignment
Reel/Frame 022512/0260

Assignment of Assignor's Interest

Recorded: 2009-04-07 Pages: 5
Assignors
TANAKA, KEIICHI
Executed: 2009-01-20
ODAWARA, AKIKAZU
Executed: 2009-01-22
NAKAYAMA, SATOSHI
Executed: 2009-01-27
IIJIMA, SUMIO
Executed: 2009-03-20
BANDOW, SHUNJI
Executed: 2009-03-11
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
X-Ray Analyzer
Patent: 7,910,888 →
Application: 12/343,364 →
Publication: US 2009/0184252
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →