X-ray analyzer
View Patent ↗Provided is an X-ray analyzer capable of significantly suppressing an influence of an external magnetic field on a transition edge sensor (TES). The X-ray analyzer includes: a TES ( 7 ) for detecting energy of a received X-ray as a temperature change and outputting the temperature change as a current signal; a superconducting magnetic shield ( 8 ) which contains the TES ( 7 ) and enters a superconducting state; and a room temperature magnetic shield ( 9 ) which covers the superconducting magnetic shield ( 8 ) and performs external magnetic field shielding until the superconducting magnetic shield ( 8 ) enters the superconducting state, in which the superconducting magnetic shield ( 8 ) and the room temperature magnetic shield ( 9 ) are concentrically arranged to have a cylindrical shape.
1. An X-ray analyzer, comprising:
a transition edge sensor for detecting energy of a received X-ray as a temperature change and outputting the temperature change as a current signal;
a superconducting magnetic shield which contains the transition edge sensor and is made of a superconducting material;
a room temperature magnetic shield which covers the superconducting magnetic shield and performs external magnetic field shielding until the superconducting magnetic shield enters a superconducting state; and
a cooling mechanism for cooling the transition edge sensor and the superconducting magnetic shield,
wherein the superconducting magnetic shield and the room temperature magnetic shield are concentrically arranged to have a cylindrical shape, and the superconducting magnetic shield has a critical magnetic field set to be equal to or larger than two times as strong as a maximum external magnetic field strength.
2. An X-ray analyzer according to claim 1 , wherein the superconducting magnetic shield includes a plurality of superconductor layers which are concentrically laminated.
3. An X-ray analyzer according to claim 1 , further comprising a copper layer portion laminated on the superconducting magnetic shield.
4. An X-ray analyzer according to claim 1 , further comprising a thermal conduction member, a tip end portion of which is coupled to a base end portion of the superconducting magnetic shield, and a base end portion of which is connected with the cooling mechanism,
wherein the base end portion of the superconducting magnetic shield and the tip end portion of the thermal conduction member are formed in a stepped shape in cross-section so as to be engageable with each other.
5. An X-ray analyzer according to claim 4 , further comprising a high-thermal conduction auxiliary member which is made of one of aluminum and copper and straddles the base end portion of the superconducting magnetic shield and the tip end portion of the thermal conduction member so as to cover an outer surface of the base end portion and an outer surface of the tip end portion.
6. An X-ray analyzer, comprising:
a transition edge sensor for detecting energy of a received X-ray as a temperature change and outputting the temperature change as a current signal;
a superconducting magnetic shield which contains the transition edge sensor and is made of a superconducting material;
a room temperature magnetic shield which covers the superconducting magnetic shield and performs external magnetic field shielding until the superconducting magnetic shield enters a superconducting state;
a cooling mechanism for cooling the transition edge sensor and the superconducting magnetic shield; and
a thermal conduction member, a tip end portion of which is coupled to a base end portion of the superconducting magnetic shield and a base end portion of which is connected with the cooling mechanism,
wherein the superconducting magnetic shield and the room temperature magnetic shield are concentrically arranged to have a cylindrical shape, and
the base end portion of the superconducting magnetic shield and the tip end portion of the thermal conduction member are formed in a stepped shape in cross-section so as to be engageable with each other.