IP Library Assignment 022567/0485
Patent Assignment
Reel/Frame 022567/0485

Assignment of Assignor's Interest

Recorded: 2009-04-20 Pages: 2
Assignors
WANG, WEIJIE
Executed: 2008-12-26
NAGLE, STEVEN
Executed: 2009-04-14
Assignee
VEECO INSTRUMENTS INC.
TERMINAL DRIVE, PLAINVIEW, NEW YORK, 11803
Covered Property (1)
Method of Fabricating a Probe Device for a Metrology Instrument and a Probe Device Produced Thereby
Patent: 8,595,860 →
Application: 12/345,465 →
Publication: US 2009/0205092
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →