Assignment of Assignor's Interest

Recorded: 2009-06-30 Pages: 3

Assignors

MATOBA, YOSHIKI

Executed: 2009-05-19

NAGASAWA, KANJI

Executed: 2009-05-20

Assignee

SII NANOTECHNOLOGY INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN

Covered Property (1)

X-Ray Analysis Apparatus and X-Ray Analysis Method

Patent: 8,068,583 →

Application: 12/494,851 →

Publication: US 2010/0002833

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.