Patent Assignment
Reel/Frame 023042/0167
Assignment of Assignor's Interest
Recorded: 2009-08-03
Pages: 3
Assignor
YOSHIKAWA, RYOJI
Executed: 2009-07-13
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Photomask Inspection Method, Semiconductor Device Inspection Method, and Pattern Inspection Apparatus