Assignment of Assignor's Interest

Recorded: 2009-07-30 Pages: 4

Assignor

BANNO, AKIHIRO

Executed: 2009-07-09

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Memory test circuit which tests address access time of clock synchronized memory

Application: 12/461,066 →

Publication: US 2010/0027359

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.