Patent Assignment
Reel/Frame 023477/0880
Assignment of Assignor's Interest
Recorded: 2009-11-05
Pages: 3
Assignors
SATO, MAKOTO
Executed: 2009-10-28
KIYOHARA, MASAHIRO
Executed: 2009-10-28
TASHIRO, JUNICHI
Executed: 2009-10-29
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Focused Ion Beam Apparatus, Sample Processing Method Using the Same, and Computer Program for Focused Ion Beam Processing
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →