Patent Assignment
Reel/Frame 023504/0543
Assignment of Assignor's Interest
Recorded: 2009-11-11
Pages: 2
Assignors
PING, WANG JIAN
Executed: 2009-11-04
LIAO, CHIN CHANG
Executed: 2009-11-04
WONG, WAISUM
Executed: 2009-11-06
Assignee
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
18 ZHANG JIANG ROAD, PUDONG NEW AREA, SHANGHAI, 201203, CHINA
Covered Property
(1)
System and Method for Test Structure on a Wafer
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.