IP Library › Assignment 023546/0892
Patent Assignment
Reel/Frame 023546/0892

Assignment of Assignor's Interest

Recorded: 2009-11-22 Pages: 6
Assignors
BERMAN, DAVID
Executed: 2003-12-08
DIKOPOLTSEV, ALEXANDER
Executed: 2003-12-08
AGNIHOTRI, DILEEP
Executed: 2005-10-20
Assignee
JORDAN VALLEY APPLIED RADIATION LTD
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Property (1)
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
Patent: 7,130,376 →
Application: 11/297,837 →
Publication: US 2006/0153333
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 10, 2010
From: JORDAN VALLEY APPLIED RADIATION LTD
To: JORDAN VALLEY SEMICONDUCTORS LTD
Reel/Frame 023750/0885 →
Change of Name Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056004/0248 →